Download this article in PDF format. Proper wiring and probing/contacting are critical to making successful measurements. When testing cells or batteries, using good engineering practices is important ...

Contact resistance, or CRES, is one of those problems that most engineers prefer not to think about until it’s staring them in the face. For years, it could be managed quietly with routine probe card ...

Even the best relays can fail at some point, but what causes them to fail? Conventional wisdom lays the blame on worn-out contacts. And there is some truth to that view. Every electromechanical relay ...

Don�t heap all the blame for a wrong measurement on the DMM. There can be several less obvious sources of the errors. Testing assemblies and components usually includes checking the continuity of ...

In the first part of this series on the highs and lows of resistance measurements, I discussed the basic principles for making two- and 4-wire resistance measurements for measuring resistances of less ...

The majority of metal traces used to produce electrical connections in semiconductor devices begin life as blanket metal films that are later patterned and etched to create conductive connections ...